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1

Charge trapping characterization in the thin oxide layer/non-conductive substrate system

J. Liebault, D. Moya-Siesse, J. Bernardini, G. Moya

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 142 KB

english, 2002

2

Influence des vitesses de trempe sur les amas de lacunes obtenus après revenu dans l'or trempé

G Moya, D Moya-Siesse, M Gillet

Journal:

Materials Science and Engineering

Year:

1972

File:

PDF, 1.76 MB

1972

3

New technique to characterise thin oxide films under electronic irradiation

J. Liébault, K. Zarbout, D. Moya-Siesse, J. Bernardini, G. Moya

Journal:

Applied Surface Science

Year:

2003

Language:

english

File:

PDF, 355 KB

english, 2003

4

Determination of the electron beam irradiated area by using a charging effect in oxide surfaces

K. Zarbout, D. Moya-Siesse, G. Moya, A. Kallel

Journal:

Journal of Non-Crystalline Solids

Year:

2005

Language:

english

File:

PDF, 204 KB

english, 2005

5

[IEEE 10th International Symposium on Electrets (ISE 10) Proceedings - Athens, Greece (22-24 Sept. 1999)] 10th International Symposium on Electrets (ISE 10). Proceedings (Cat. No.99 CH36256) - Specific heat of solid dielectrics charged at room temperature

Moya, G., Moya-Siesse, D., Blaise, G.

Year:

1999

Language:

english

File:

PDF, 197 KB

english, 1999

6

Effect of strain on stored energy and recrystallization of straight-rolled silver

Zahia, A., Salhi, F., Aride, J., Moya-Siesse, D., Moya, G.

Journal:

Journal of Alloys and Compounds

Year:

1992

Language:

english

File:

PDF, 271 KB

english, 1992

7

[IEEE IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP'94) - Arlington, TX, USA (23-26 Oct. 1994)] Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP'94) - Dopant effect on trapping charge properties studied by the mirror method correlated with C/sub p/ measurement

Moya-Siesse, D., Sami, A., Moya, G., Le Gressus, C.

Year:

1994

Language:

english

File:

PDF, 254 KB

english, 1994

8

[IEEE 1995 Conference on Electrical Insulation and Dielectric Phenomena - Virginia Beach, VA, USA (22-25 Oct. 1995)] Proceedings of 1995 Conference on Electrical Insulation and Dielectric Phenomena - Characterization of charge trapping/detrapping phenomena by calorimetric measurements in charged dielectrics

Moya-Siesse, D., Sami, A., Moya, G.

Year:

1995

Language:

english

File:

PDF, 387 KB

english, 1995

9

[IEEE IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93) - Pocono Manor, PA, USA (17-20 Oct. 1993)] Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93) - Free energy variation due to a space charge formation

Moya-Siesse, D., Moya, G., Le Gressus, C.

Year:

1993

Language:

english

File:

PDF, 236 KB

english, 1993

10

Relaxation Study in Y2O3 after Polarization Induced by an Electron Beam

Moya, Gérard, Sami, A., Moya-Siesse, Denise

Journal:

Advanced Materials Research

Year:

1994

Language:

english

File:

PDF, 518 KB

english, 1994

11

Fast solute diffusion in solid and supersaturated solid solutions

Moya, Gérard, Moya-Siesse, Denise

Journal:

Phase Transitions

Year:

1988

Language:

english

File:

PDF, 515 KB

english, 1988

12

Consequences of Silicon Segregation on the Dielectric Properties of Sintered Alumina

Zarbout, Kamel, Moya, Gérard, Bernardini, Jean, Moya-Siesse, Denise, Si Ahmed, A., Kansy, Jerzy, Gœuriot, Dominique

Journal:

Defect and Diffusion Forum

Year:

2006

Language:

english

File:

PDF, 279 KB

english, 2006

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